SERGEI ESKIN
6161 Bathurst St.,
apt.#1101 Tel. (416)
590-0598
________________________________________________________________________
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Over
15 years experience in processing of materials and technologies of semiconductors, thin films, surface coatings and
surface modification
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Experienced in design of experiments, data
processing and analysis, development
and implementation of technological processes
·
Computer
skills: MS DOS, Windows95/NT, MS Office, MS Excel, applied PC-based programs
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Study, development and implementation of technologies using laser
processing and coating deposition
- Obtained thin films of Ti and Zr nitrides by interaction of CO2
and excimer laser beam with nitride
forming metals (Ti and Zr) under nitrogen flow
- Deposited Si oxide and nitride films using irradiation of
excimer laser (CVD technique)
- Processed
polymer materials using excimer laser to modify surface properties
- Performed nitriding of carbon-, tool- and stainless steels by
laser processing in the nitrogen atmosphere
- Hardened
carbon- and alloy steels by irradiation of CO2 laser and
plasma arc
- Cleaned and processed brittle materials (natural stones)
- Applied laser beam for dimensional treatment (hole drilling) and
cutting of sheet metals and non-metal materials
- Plated electrochemically conventional and composite (with
ceramic particles) Cr, Au coatings and
alloy deposits Co-W, Ni-Cr and Ni-P
- Colored
steels chemically/electrochemically
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Developed and implemented blackening of
steel blades for Bond America-Israel Blades Ltd.
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Developed suitable applications of cathode arc PVD hard coatings such as TiN, TiAlN
etc. and offered best solutions for customer needs
· Study, development and
implementation of semiconductor technologies
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Developed diffusion technologies on PIN and APD InGaAs/InP epitaxial
wafers, improved standard operation procedures, communicated with R&D
department to verify and implement new solutions into production line
- Developed and performed
Zn diffusion doping on GaP, GaAsP and
GaAlAs epitaxial wafers and thermal annealing of semiconductors III-V
- Applied statistical (6 s) approach for analysis and optimization of
technological processes including run charts, CNX, IPO, etc.
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Fabricated light-emitting diodes on GaAsP and GaP epitaxial wafers
- Carried out plasma and
wet etching of silicon oxide and nitride films, silicon and semiconductors
III-V
- Deposited (PECVD
technique) Si-based dielectric films and amorphous Si to verify and optimize
deposition parameters
- Produced waveguide
ridges on CBE InGaAsP/InP wafers including cleaning, patterning, wet and dry (RIE 1000) etching and microscopic
examination of ridges
- Developed
and carried out VPE of GaInAsP, GaAsP and LPE of GaAs:Si and GaAlAs wafers
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Thinned and polished semiconductor samples
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Used experience to work in clean room environment
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Testing of materials and thin films
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Examined
morphology, microstructure and carried out elemental analysis using optical microscopes, SEM JEOL 840,
6300 and 6400 (image & EDX techniques)
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Performed
metallographic examination of metals
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Analyzed phase composition, residual stress and
lattice parameters using x-ray, diffractometer Phillips, the PW-1820
Brag-Brentano goniometer
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Characterized
thin films using stress analyzer, nanospec, ellipsometer, profilometer and
FTIR-technique
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Examined
hardness, wear resistance and corrosion behavior
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Used
different analytical techniques including XPS, Auger, SIMS, TEM and
electrochemical C-V method (Polaron) for material analysis and development of
technologies
2001
- 2002 PerkinElmer Optoelectronics, Montreal
Senior
Member Technical Staff. III-V Process Group. Diffusion
2000 – 2001 Sputtek Thin Film Hard Coatings, Toronto
Application Specialist
2000 Bodycote
Ortech, Mississauga
Application/Engineering Consultant
1997-1998 Institute for
Microstructural Sciences,
Technologist. Microfabrication Group
1991-1997
Israel Technical University (Technion),
Faculty of Materials Engineering, Haifa, Israel
Project/R&D Engineer
1979-1990 Materials Engineering
Centre, Moscow, Russia
EDUCATION and TRAINING
1992, 1994 Qualification Courses on Materials
Examination (SEM, EDX, X-ray, TEM).
1979 Ph.D. in Materials Engineering.
Moscow University of Electronics Engineering, Moscow, Russia
1976 M.Sc.
in Materials Engineering
REFERENCES Available upon request